RF Design Verification with RF View

Design Verification Objectives

Before a design goes to production, design verification (DV) confirms that: (1) the prototype meets all specification requirements, (2) the design is robust to component variation (yield ≥ target), and (3) performance is within the margin specified by the reliability/temperature analysis. RF View supports steps 1 and 2 directly.

Step 1: S-Parameter Specification Check

  Load all prototype measurements into RF View:
  Unit 1 (DUT1), Unit 2 (DUT2), Unit 3 (DUT3) .s2p files

  For each unit, verify all S-parameter specifications:
  ✓ S11 < −10 dB across 880–915 MHz
  ✓ S11 < −10 dB across 925–960 MHz
  ✓ S21 > −0.8 dB at 897 MHz (band center)
  ✓ S22 < −10 dB across both bands

  Multi-file overlay: load all 3 units → all 3 traces should be within spec
  Table Marker at critical frequencies → record values for report

Step 2: Sim vs Measured Comparison

  Load both files:
  - Circuit Simulator → Send to Plot → Sim_Result (simulation)
  - Measured PCB (VNA) → DUT.s2p (measurement)

  Overlay on same chart:
  Frequency shift: f₀_sim = 902 MHz, f₀_meas = 895 MHz (0.8% shift)
  IL: IL_sim = 0.35 dB, IL_meas = 0.48 dB (layout parasitic impact)
  S11 depth: sim = −22 dB, meas = −15 dB (still passes >−10 dB spec)

  Document all deviations → identify root causes → update simulation model

Step 3: Monte Carlo Yield Sign-Off

  Updated simulation model (calibrated to measured data):
  Run 1000 Monte Carlo iterations with ±5% tolerance

  Results:
  Yield (all specs pass): 941/1000 = 94.1%
  Target yield: ≥90% → PASS

  Sign-off criteria met. Document:
  - Design: L-network for 900 MHz PA matching
  - Nominal performance: measured at 25°C, 3.3V, 100 mA
  - Yield: 94.1% at ±5% component tolerance
  - Temperature derating: to be verified separately

Related Topics

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