Vendor Qualification Process
Before approving a new RF component supplier or a new component part number, engineering must verify that the device meets all electrical specifications across multiple units and lot dates. RF View streamlines this process by enabling batch S-parameter comparison and automated summary reporting.
Initial Qualification: Type Approval
Required measurements (typically 5–10 units from first lot): - S-parameter .s2p for each unit - Measurements at nominal (25°C) and temperature extremes (−40, +85°C) - Multiple frequency bands if device is multi-band RF View analysis: 1. Load all units simultaneously → visual overlay → identify outliers 2. Table Marker at specification frequencies → record values for all units 3. Statistical summary: mean, sigma, min, max across all units 4. Summary CSV export for qualification report documentation
Ongoing Lot Monitoring: AQL Sampling
| Lot Size | AQL Sample Size | Accept/Reject Criteria |
|---|---|---|
| <500 units | 5–8 samples | 0 failures: Accept; 1+ failures: Reject |
| 500–3000 units | 13–20 samples | <2 failures: Accept; 2+ failures: Reject |
| >3000 units | 32–50 samples | <3 failures: Accept; 3+ failures: Reject |
Vendor Comparison for Design-In
Scenario: Selecting LTE Band 3 SAW filter from 3 vendors Load vendor_A_10units.s2p × 10 files Load vendor_B_10units.s2p × 10 files Load vendor_C_10units.s2p × 10 files RF View multi-file overlay: 30 traces per chart Table Marker at 1815 MHz: all 30 IL values visible simultaneously Summary Export → CSV with mean/sigma per vendor Decision: Vendor A (IL = 1.8 ± 0.1 dB) vs Vendor B (IL = 2.1 ± 0.3 dB) Vendor A wins: lower mean IL AND tighter lot-to-lot variation
RF View Vendor Qualification: Multi-file overlay handles 30+ files for cross-vendor comparison. Summary Export generates per-file metrics. Table Marker reads all units at specification frequencies simultaneously. Free on Android.